...
首页> 外文期刊>Langmuir: The ACS Journal of Surfaces and Colloids >Scanning Spreading Resistance Microscopy: A Promising Tool for Probing the Reaction Interface of Li-Ion Battery Materials
【24h】

Scanning Spreading Resistance Microscopy: A Promising Tool for Probing the Reaction Interface of Li-Ion Battery Materials

机译:扫描散布性显微镜:探讨锂离子电池材料反应界面的有希望的工具

获取原文
获取原文并翻译 | 示例
           

摘要

Imaging of the Li-insertion/extraction [Li-in/out] interface of the electrode materials of Li-ion batteries is essential to reveal their bulk mechanism of electrochemical reaction and phase behavior in the crystal. Generally, the material properties significantly change at this interface. Therefore, direct probing of the changing properties is a promising approach to reliably investigate the Li-in/out interface in the bulk crystal of electrode materials. In this study, we investigated the change in electron conductivity of rutile-TiO2 with Li-insertion and extraction, as a model for the electrochemical interface of a bulk crystal of electrode material. In addition, we probed the interface using logarithm contact resistance [log R (Omega)] imaging via scanning spreading resistance microscopy (SSRM). A distinct Li-in/out interface on the rutile-TiO2(001) wafer was observed using this technique. The imaging resolution of this region was estimated to be approximately 40-50 nm in SSRM images, which was two to three times higher than the resolution of the topographic image (100-150 nm), which was restricted to the curvature radius of the SSRM probe tip. A high spatial resolution was obtained via SSRM imaging because this approach is not influenced by the geometric effects of the surface. This result demonstrated the potential of SSRM imaging for the study of the Li-in/out interface.
机译:成像的Li插入/抽出的[锂/缩小]的锂离子电池的电极材料的界面是必不可少的以显示晶体中的电化学反应和相行为的它们的体积机制。一般而言,材料性能显著在这个界面中更改。因此,直接改变性质的探测是一个有希望的方法可靠地调查在电极材料的块状晶体的Li /出接口。在这项研究中,我们调查与锂插入和提取的金红石二氧化钛的电子传导性的变化,作为用于电极材料的块状晶体的电化学界面的模型。此外,我们通过扫描扩展电阻显微镜(SSRM)探测使用对数的接触电阻[日志R(欧米茄)]成像的接口。一个明显的锂/出界面上的晶片使用该技术所观察到的金红石二氧化钛(001)。该区域的成像分辨率,估计是在图像SSRM约40-50纳米,这比地形图像的分辨率(100-150纳米),将其限制在SSRM的曲率半径高2〜3倍探针尖端。因为这种方法不被表面的几何效应的影响经由SSRM成像进行,得到高空间分辨率。该结果证实了李进/出接口的研究SSRM成像的潜力。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号