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Attachable and flexible aluminum oxide resistive non-volatile memory arrays fabricated on tape as the substrate

机译:可连接和柔性的氧化铝电阻非易失性存储器阵列作为基板制造在胶带上

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摘要

We fabricated 8 x 8 arrays of non-volatile resistive memory devices on commercially available Scotch (R) Magic (TM) tape as a flexible substrate. The memory devices consist of double active layers of Al2O3 with a structure of Au/Al2O3/Au/Al2O3/Al (50 nm/20 nm/20 nm/20 nm/50 nm) on attachable tape substrates. Because the memory devices were fabricated using only dry and low temperature processes, the tape substrate did not suffer from any physical or chemical damage during the fabrication. The fabricated memory devices were turned to the low resistance state at similar to 3.5 V and turned to the high resistance state at similar to 10 V with a negative differential resistance region after similar to 5 V, showing typical unipolar non-volatile resistive memory behavior. The memory devices on the tape substrates exhibited reasonable electrical performances including a high ON/OFF ratio of 10(4), endurance over 200 cycles of reading/writing processes, and retention times of over 10(4) s in both the flat and bent configurations.
机译:我们在市售的苏格兰(R)魔术(TM)胶带上制造了8 x 8阵列的非易失性电阻存储器装置,作为柔性基板。存储器件由Al2O3的双活性层组成,可在可连接的带衬底上具有Au / Al 2 O 3 / Au / Al 2 O 3 / Al(50nm / 20nm / 20nm / 20nm / 50nm / 50nm / 50nm)的结构。因为仅使用干燥和低温过程制造了存储器件,所以胶带基板在制造过程中没有遭受任何物理或化学损伤。制造的存储器件转向类似于3.5V的低电阻状态,并且在类似于5V的情况下,在负差分电阻区域类似于10V的高电阻状态,显示出典型的单极性非易失性电阻存储器行为。磁带基板上的存储器件表现出合理的电气性能,包括高开/关比为10(4),耐久性超过200个循环的读取/写入过程,并且平坦和弯曲中的超过10(4)秒的保留时间配置。

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