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Mapping reversible photoswitching of molecular resistance fluctuations during the conformational transformation of azobenzene-terminated molecular switches

机译:映射在偶氮苯封端的分子开关的构象转化期间分子抗性波动的可逆照片

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We report a direct mapping and analysis of electrical noise in azobenzene-terminated molecular monolayers, revealing reversible photoswitching of the molecular resistance fluctuations in the layers. In this work, a conducting atomic force microscope combined with a homemade spectrum analyzer was used to image electrical current and noise at patterned self-assembled monolayers (SAMs) of azobenzene-terminated molecular wires on a gold substrate. We analyzed the current and noise imaging data to obtain maps of molecular resistances and amount of mean-square fluctuations in the resistances of the regions of trans-azobenzene and a cis/trans-azobenzene mixture. We revealed that the fluctuations in the molecular resistances in the SAMs were enhanced after the trans-to-cis isomerization, while the resistances were reduced. This result could be attributed to enhanced disorders in the molecular arrangements in the cis-SAMs. Furthermore, we observed that the changes in the resistance fluctuations were reversible with respect to repeated trans-to-cis and cis-to-trans isomerizations, indicating that the effects originated from reversible photoswitching of the molecular structures rather than irreversible damages of the molecules. These findings provide valuable insights into the electrical fluctuations in photoswitchable molecules, which could be utilized in further studies on molecular switches and molecular electronics in general.
机译:我们报告了偶氮苯封端的分子单层中电噪声的直接映射和分析,揭示了层中的分子抗性波动的可逆照片。在这项工作中,使用与自制频谱分析仪结合的导电原子力显微镜用于在金基底上的偶氮苯封端的分子线的图案化的自组装单层(SAMS)处的电流和噪声。我们分析了电流和噪声成像数据,以获得分子电阻的映射和转基偶氮区域的电阻和CIS / Trans-偶氮苯混合物的电阻中的平均方形波动量。我们透露,在反式-CIS异构化后,SAMS中的分子电阻的波动增强,而抗性降低。该结果可归因于CIS-SAM的分子布置中的增强障碍。此外,我们观察到,相对于重复的反式-CIS和顺式 - 反式异构化,抗性波动的变化是可逆的,表明效应来自分子结构的可逆照片,而不是分子的不可逆损伤。这些发现提供了有价值的见解,可以在光学开关分子中的电波动方面提供有价值的洞察力,其可用于进一步研究分子开关和分子电子的研究。

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