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首页> 外文期刊>Nanotechnology >Synaptic characteristics with strong analog potentiation, depression, and short-term to long-term memory transition in a Pt/CeO2/Pt crossbar array structure
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Synaptic characteristics with strong analog potentiation, depression, and short-term to long-term memory transition in a Pt/CeO2/Pt crossbar array structure

机译:PT / CEO2 / PT横杆阵列结构中具有强大的模拟增强,凹陷和短期到长期记忆过渡的突触特征

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A crossbar array of Pt/CeO2/Pt memristors exhibited the synaptic characteristics such as analog, reversible, and strong resistance change with a ratio of similar to 10(3), corresponding to wide dynamic range of synaptic weight modulation as potentiation and depression with respect to the voltage polarity. In addition, it presented timing-dependent responses such as paired-pulse facilitation and the short-term to long-term memory transition by increasing amplitude, width, and repetition number of voltage pulse and reducing the interval time between pulses. The memory loss with a time was fitted with a stretched exponential relaxation model, revealing the relation of memory stability with the input stimuli strength. The resistance change was further enhanced but its stability got worse as increasing measurement temperature, indicating that the resistance was changed as a result of voltage-and temperature-dependent electrical charging and discharging to alter the energy barrier for charge transport. These detailed synaptic characteristics demonstrated the potential of crossbar array of Pt/CeO2/Pt memristors as artificial synapses in highly connected neuron-synapse network.
机译:的Pt /氧化铈/铂忆阻器的交叉杆阵列表现出突触特性,诸如模拟的,可逆的,并与相似于图10(3)的比率强烈电阻变化,对应于突触权重调制作为增强和抑郁相对于宽动态范围的到电压极性。此外,它提出与时间相关的反应,如双脉冲易并通过增加振幅,宽度和电压脉冲的重复次数和减少脉冲之间的间隔时间的短期至长期记忆的过渡。有时间的记忆丧失装有一个拉伸的指数松弛模型,揭示了内存的稳定性与输入的刺激强度的关系。电阻变化被进一步增强,但其稳定性变得更糟作为增加测定温度,表明电阻改变为电压和温度依赖性电充电的结果和放电以改变用于电荷传输的能量势垒。这些详细的突触特征证实的Pt /氧化铈/铂忆阻器作为高度连接的神经元突触网络人工突触的交叉杆阵列的潜力。

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