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Electronic structure of stoichiometric and oxygen-deficient ferroelectric Hf0.5Zr0.5O2

机译:化学计量和缺氧铁电HF0.5ZR0.5O2的电子结构

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The electronic structure of oxygen-deficient Hf0.5Zr0.5O2 in the non-centrosymmetric orthorhombic (ferroelectric) phase was investigated by means of x-ray photoelectron spectroscopy and first-principle density functional theory calculations. It was established that a peak in the photoelectron spectra observed at an energy above the valence band top of ferroelectric Hf0.5Zr0.5O2 in ion-etched samples was due to oxygen vacancies. A method for evaluating the oxygen vacancies concentration in the material from the comparison of experimental and theoretical photoelectron spectra of the valence band is proposed. It is found that oxygen polyvacancies are not formed in ferroelectric Hf0.5Zr0.5O2: an energy-favorable spatial arrangement of several oxygen vacancies in the crystal corresponds to the configuration formed by noninteracting vacancies distant from each other. The oxygen vacancies in five charged states were simulated. The electron levels in the bandgap caused by charged oxygen vacancies indicate that any type of oxygen vacancies in ferroelectric Hf0.5Zr0.5O2 can capture both electrons and holes, i.e. can act as an amphoteric localization center for charge carriers.
机译:通过X射线光电子能谱和第一原理密度函数理论计算研究了非亚里索对称正交(铁电)相中的缺氧HF0.5ZR0.5O2的电子结构。建立了在离子蚀刻样品中的低于铁电HF0.50.5O2的价带顶部的能量下观察到的光电子光谱中的峰值是由于氧空位。提出了一种评价材料中氧空位浓度的方法,从比较的价带的实验和理论光电子光谱比较中的浓度。结果发现,氧气多涂层不是在铁电HF0.5ZR0.5O2中形成的:晶体中几个氧空位的能量良好空间排列对应于通过彼此远离的非交互空位形成的构造。模拟了五种指控状态的氧气空缺。带电氧空位引起的带隙中的电子电平表明铁电HF0.5ZR0.5O2中的任何类型的氧空位都可以捕获电子和孔,即可以充当电荷载体的两性定位中心。

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