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Tiny nano-scale junction built on B/N doped single carbon nanotube

机译:基于B / N掺杂单碳纳米管的微小纳米级结

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摘要

The characteristic sizes of carbon nanotube (CNT)-based devices are constantly being reduced. However, this continuing miniaturization is still facing many problems and requires innovative ideas and structures. By regular doping of boron and nitrogen atoms in a semiconducting single-wall carbon nanotube (SWCNT), we have constructed a nano-scale junction with rectifying characteristics. The I-V curve of our junction resembles the I-V curve of an ideal diode with a p-n junction. This junction channel is about 0.6 nm wide and 3.4 nm long, and the footprint is 5.1 nm long. Under a 0.5 V bias, the junction has a leakage current of -8.8 x 10(-3) mu A, a rectifying ratio I-on/I-off of 0.716 x 10(3), and a current density of 10.52 mA mu m(-1). Our study also shows how different dopant distributions influence the I-V curve. Such a regular nano-scale doping method is effective and important, compared with the traditional random doping method.
机译:碳纳米管(CNT)基于碳的特性尺寸恒定地减小。 然而,这种持续的小型化仍面临着许多问题,需要创新的思想和结构。 通过在半导体单壁碳纳米管(SWCNT)中常规掺杂硼和氮原子,我们构成了具有整流特性的纳米级结。 我们结的I-V曲线类似于具有P-N结的理想二极管的I-V曲线。 该接合通道约为0.6nm宽,3.4 nm长,占地面积为5.1 nm。 在0.5V偏压下,结的漏电流为-8.8×10(-3)mu a,整流比I-ON / I-OFF为0.716×10(3),电流密度为10.52 mA mm m(-1)。 我们的研究还表明了不同的掺杂剂分布如何影响I-V曲线。 与传统的随机掺杂法相比,这种常规纳米级掺杂方法是有效且重要的。

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