Brillouin light scattering spectroscopy was used to determine elastic properties of porous silicon films and superlattices. The film elastic properties were compared with previously published results and also used as input for an effective elastic medium model (M Grimsditch and F Nizzoli 1986, Phys. Rev. B 33 5891) to predict the elastic constants of porous silicon superlattices with constituent layers comprised of thin copies of the films. Values of superlattice elastic constants c_(33) and c_(44) obtained from the model show reasonably good agreement with those determined directly from superlattice Brillouin data while constants c_(11) and c_(13) show crude agreement. This partial agreement suggests that the model holds promise as a means for accurately predicting the elastic properties of p-Si SLs. The results of this study show that it is possible to tailor porous silicon superlattices for custom applications as well as further fundamental studies.
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机译：布里渊光散射光谱法用于确定多孔硅膜和超晶格的弹性。将该薄膜的弹性特性与先前发表的结果进行了比较，并用作有效的弹性介质模型的输入（M Grimsditch和F Nizzoli 1986，Phys。Rev. B 33 5891），以预测具有组成层的多孔硅超晶格的弹性常数电影的薄拷贝。从模型获得的超晶格弹性常数c_（33）和c_（44）的值与直接根据超晶格布里渊数据确定的弹性值显示出合理的一致性，而常数c_（11）和c_（13）则显示出粗糙的一致性。这一部分协议表明，该模型具有希望，可以作为准确预测p-Si SLs弹性性能的手段。这项研究的结果表明，可以为定制应用定制多孔硅超晶格以及进一步的基础研究。
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