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首页> 外文期刊>Journal of nanoscience and nanotechnology >High Internal Gain Axial SiOx-In2-xO3-y/Au Heterostructure Nanocolumnar Array Based Schottky Detector for Broad Band Recognition
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High Internal Gain Axial SiOx-In2-xO3-y/Au Heterostructure Nanocolumnar Array Based Schottky Detector for Broad Band Recognition

机译:高内部增益轴向SiOx-In2-xO3-y / Au异质结构纳米柱阵列基于肖特基探测器的宽带识别

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Glancing angle deposition (GLAD) was employed to fabricate the SiOx-In2-xO3-y axial heterostructure nanocolumn. The fabricated heterostructure nanocolumn was annealed at 550 degrees C for 1 hour at open air condition. The XRD analysis revealed the polycrystalline nature of the annealed SiOx-In2-xO3-y nanocolumn. The emission at 378 nm (similar to 3.3 eV, FWHM 39.101 nm) from Photoluminescence (PL), corresponds to main band gap of In2O3. The In2-xO3-y-SiOx nanocolumn based Schottky detector processed maximum photoresponsivity of 199 NW at 375 nm, as well as UV-Vis broad band detection. The high internal gain of similar to 659 at UV region (375 nm) was calculated for the device. The detector exhibited increase in photoresponsivity with decrease in room temperature upto 160 K, which further reduced at low temperature. A very sharp rise time (similar to 1.82 s) and decay time (similar to 1.78 s) was recorded at the applied potential of -2 V and -3 V.
机译:采用掠角沉积(GLAD)制备SiOx-In2-xO3-y轴向异质结构纳米柱。将制造的异质结构纳米柱在露天条件下于550摄氏度退火1小时。 XRD分析表明,退火后的SiOx-In2-xO3-y纳米柱具有多晶性质。来自光致发光(PL)的378 nm(类似于3.3 eV,FWHM 39.101 nm)的发射对应于In2O3的主带隙。基于In2-xO3-y-SiOx纳米柱的肖特基检测器处理了375 nm处最大199 NW的光响应,以及UV-Vis宽带检测。计算出该器件在UV区域(375 nm)处的高内部增益类似于659。随着室温的降低,检测器显示出最高160 K的光响应性增加,而在低温下则进一步降低。在-2 V和-3 V的施加电势下,记录到了非常陡峭的上升时间(约1.82 s)和衰减时间(约1.78 s)。

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