Effects of thermal treatment on microstructure of rapidly solidified Al-2.1 at. percent Mn alloy studied by RBS technique

摘要

Rutherford backscattering spectroscopy (RBS) technique with computer simulations are developed for numerical analysis of the level-by-level element composition of rapidly solidified foils of the Al-Mn alloy. It has been obtained that the manganese depth distribution in the foils is irregular in the near-surface region of the samples. Thin surface layer (0.03 mu m) is impoverished by manganese in a substrate region. Depth-dependent elemental composition of the foils remains constant after annealing at 200 deg C. The manganese content of surface layer grows with increasing of annealing temperature. A correlation of dope depth profiles and both phase composition and surface of analysis of the annealed foils is observed.