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Design, synthesis, and photosensitive performance of polymethacrylate-positive photoresist-bearing o-nitrobenzyl group

机译:含聚甲基丙烯酸酯正性光刻胶的邻硝基苄基的设计,合成及光敏性能

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摘要

Novel polymethacrylate-positive photoresist-bearing o-nitrobenzyl group was described herein. The matrix polymer (PCHIBNB) was synthesized by copolymerization of cyclohexyl methacrylate (CHMA), isobornyl methacrylate (IBMA), and o-nitrobenzyl methacrylate (NBMA) via reversible addition fragmentation chain transfer (RAFT) polymerization method. After UV irradiation, the o-nitrobenzyl groups of PCHIBNB were photocleaved and the resulting carboxyl groups were highly alkali-soluble, so that the matrix polymer could be etched by mild alkali solution with no requirements of photosensitizers or photoacid generators. PCHIBNB was characterized by Fourier transform infrared spectroscopy (FTIR), proton nuclear magnetic resonance (H-1-NMR) spectroscopy, and gel permeation chromatography (GPC). The photocleavable behaviors of PCHIBNB were determined by FTIR, H-1-NMR, thermogravimetric analysis (TGA), and differential scanning calorimetry (DSC) analysis. The resist formulated with this polymer and cast in tetrahydrofuran (THF) solution showed 10 m x 10 m square pattern using a mercury-xenon lamp in a contact printing mode and tetramethyl-ammonium hydroxide aqueous solution as a developer. (c) 2014 Wiley Periodicals, Inc. J. Appl. Polym. Sci. 2015, 132, 41733.
机译:本文描述了新型的带有聚甲基丙烯酸酯-正性光致抗蚀剂的邻硝基苄基。通过可逆加成断裂链转移(RAFT)聚合方法,通过甲基丙烯酸环己酯(CHMA),甲基丙烯酸异冰片酯(IBMA)和甲基丙烯酸邻硝基苄酯(NBMA)的共聚反应合成基质聚合物(PCHIBNB)。紫外线照射后,光裂解了PCHIBNB的邻硝基苄基,所得羧基具有高度的碱溶性,因此无需使用光敏剂或光致产酸剂即可用温和的碱溶液蚀刻基体聚合物。 PCHIBNB的特征在于傅立叶变换红外光谱(FTIR),质子核磁共振(H-1-NMR)光谱和凝胶渗透色谱(GPC)。通过FTIR,H-1-NMR,热重分析(TGA)和差示扫描量热法(DSC)分析确定PCHIBNB的光裂解行为。用该聚合物配制并在四氢呋喃(THF)溶液中浇铸的抗蚀剂在接触印刷模式下使用水银氙气灯和四甲基氢氧化铵水溶液作为显影剂,显示出10 m x 10 m的方形图案。 (c)2014 Wiley Periodicals,Inc. J. Appl。 Polym。科学2015,132,41733。

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