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首页> 外文期刊>The journal of physical chemistry, C. Nanomaterials and interfaces >Crystal Phase and Facet Effects on the Structural Stability and Electronic Properties of GaP Nanowires
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Crystal Phase and Facet Effects on the Structural Stability and Electronic Properties of GaP Nanowires

机译:晶相和刻面对GaP纳米线结构稳定性和电子性能的影响

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The control of electronic properties of GaP nanowires is of particular importance for their applications in nanoelectronics and optoelectronics. However, a fundamental understanding is still lacking of atomic and electronic properties of GaP nanowires due to the diversity of the crystal phase in the fabricated nanowires. Here we reveal the crucial role of the crystal phase and nanowire facets in the structural and electronic properties of zinc-blende, wurtzite, and polytypic GaP nanowires by using the first-principles calculations. The stability mechanism of GaP nanowires depends on the competition between the crystal phase and facet effects: the former dominates the stability of larger-sized nanowires, but the stability of ultrathin nanowires is mainly determined by the latter. This mechanism can be applied to explain a large amount of experimental observations about the formation of stacking faults and twin defects during the growth of III-V semiconductor nanowires. Likewise, electronic properties of GaP nanowires, including band gap values and the band structure characteristic, are sensitive to not only the nanowire size but also the crystal phase. Moreover, the quantitative relationship between the band gap of GaP nanowire polytypes and their diameter has been established, and the calculated band gaps agree well with the experimental data. Our results can provide a theoretical guidance for engineering electronic structures of GaP nanowires as well as their applications in optoelectronic devices.
机译:GaP纳米线的电子特性的控制对于它们在纳米电子学和光电子学中的应用特别重要。然而,由于所制造的纳米线中晶相的多样性,GaP纳米线的原子和电子性质仍然缺乏基本的了解。在这里,我们通过使用第一性原理计算来揭示晶相和纳米线刻面在闪锌矿,纤锌矿和多型GaP纳米线的结构和电子性能中的关键作用。 GaP纳米线的稳定性机制取决于晶相和刻面效应之间的竞争:前者主导较大尺寸纳米线的稳定性,而超薄纳米线的稳定性主要由后者决定。该机制可用于解释有关III-V半导体纳米线生长过程中堆叠缺陷和孪晶缺陷形成的大量实验观察。同样,GaP纳米线的电子特性(包括带隙值和能带结构特性)不仅对纳米线尺寸敏感,而且对晶相敏感。此外,建立了GaP纳米线多型体的带隙与其直径之间的定量关系,计算出的带隙与实验数据吻合良好。我们的结果可以为GaP纳米线的工程电子结构及其在光电器件中的应用提供理论指导。

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