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首页> 外文期刊>The journal of physical chemistry, A. Molecules, spectroscopy, kinetics, environment, & general theory >Hole transport in triphenylamine based OLED devices: From theoretical modeling to properties prediction
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Hole transport in triphenylamine based OLED devices: From theoretical modeling to properties prediction

机译:三苯胺基OLED器件中的空穴传输:从理论建模到性能预测

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For the series of para-substituted triphenylamines, optimized geometries, HOMO and LUMO energy levels, ionization potentials Ip, reorganization energies for hole transport λ_+, and frontier orbital contours have been calculated by means of ab initio computations. Relationships between them and the Hammett parameter are presented. According to calculations, electron releasing substituents increase the HOMO and LUMO energies of TPA, while electron withdrawing ones decrease it. This behavior is reflected in subsequent decreasing and increasing of ionization potentials of substituted TPAs. Calculations show that there exists also a strong substituent effect on the reorganization energy λ_+, which is a dominating factor of hole mobility. It is concluded that proper tuning of the HOMO and LUMO levels (and, as a result, ionization potential, Ip) and reorganization energy λ_+ (consequently, hole mobility) of the triphenylamine can be done by alteration of the TPA electronic structure by an appropriate substitution. It is demonstrated that the proper adjustment of the HOMO levels of HTM facilitates the reduction of an energy barrier at the interface of ITO/HTL and HTL/EL and ensure the high hole injection and hole transport rate. On the other hand, appropriate adjustment of the LUMO level prevents an electron leak from the EL into the HTM layer. Results of these calculations can be useful in the process of designing new HTM materials of desired properties (high efficiency, stability, and durability). (Figure presented)
机译:对于一系列对位取代的三苯胺,已经通过从头算算得到了优化的几何形状,HOMO和LUMO能级,电离势Ip,空穴传输的重组能λ_+和前沿轨道轮廓。介绍了它们与Hammett参数之间的关系。根据计算,电子释放的取代基增加了TPA的HOMO和LUMO能量,而吸电子的取代基则降低了TPA的HOMO和LUMO能量。此行为反映在取代的TPA的电离电势的随后降低和提高中。计算表明,对重组能λ_+也有很强的取代作用,这是空穴迁移率的主要因素。结论是,可以通过改变TPA电子结构来适当调节三苯胺的HOMO和LUMO水平(以及因此的电离电势Ip)和重组能λ_ +(因此,空穴迁移率)。适当的替代。结果表明,适当调整HTM的HOMO含量有助于减少ITO / HTL和HTL / EL界面处的能垒,并确保高空穴注入和空穴传输速率。另一方面,适当调节LUMO能级可防止电子从EL泄漏到HTM层。这些计算的结果在设计具有所需特性(高效,稳定和耐用)的新型HTM材料的过程中可能很有用。 (图示)

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