首页> 外文期刊>The Journal of Chemical Physics >The dissociative adsorption of hydrogen on Pt(111): Actuation and acceleration by atomic defects
【24h】

The dissociative adsorption of hydrogen on Pt(111): Actuation and acceleration by atomic defects

机译:氢在Pt(111)上的解离吸附:原子缺陷的驱动和加速

获取原文
获取原文并翻译 | 示例
           

摘要

The dissociation of hydrogen at atomic surface defects is the strongly dominant, if not the decisive, step in the chain of events eventually leading to chemisorbed H-atoms on Pt(111). This holds for perpendicular kinetic energies of the gas phase molecules from 8 to 60 meV, i.e., covering the range relevant to hydrogenation reactions. This insight has been gained in the present study in which we reversibly varied the defect density on one and the same crystal in a controlled way. Information has been derived from measuring the adsorption kinetics as a function of coverage. Two distinct adsorption channels are distinguished. The first, indirect one, prevails at lower H-coverage and involves capture into a non-accommodated molecular precursor state followed by dissociation at step sites as described in our recent paper. The second one, dominant at higher coverage and non-negligible defect densities, obeys second order Langmuir kinetics. Here the dissociative adsorption takes place directly at step sites with a cross section of 0.24 unit cells (initial sticking probability 24 of the step density). These results are consistent with thermally programmed desorption data: the direct channel is responsible for the emergence of the low temperature peak in thermal desorption spectroscopy, usually denoted with 1, while the indirect channel is represented by the _2 state. The dependence on the perpendicular component of the hydrogen kinetic energy is distinctly different for the two channels: the indirect one shows power law behavior with an exponent 1.9 0.1, while the direct one shows no perpendicular energy dependence at all.
机译:氢在原子表面缺陷处的解离是事件链中的主要步骤,即使不是决定性步骤,该步骤最终会导致化学吸附在Pt(111)上的H原子。这对于气相分子的垂直动能保持为8至60meV,即覆盖与氢化反应有关的范围。在本研究中已经获得了这一见解,在该研究中,我们以可控的方式可逆地改变了一个晶体和同一晶体上的缺陷密度。信息是通过测量吸附动力学随覆盖率的变化而得出的。区分了两个不同的吸附通道。第一个是间接的,主要存在于较低的H覆盖率下,涉及捕获到一种非适应性分子前体状态,然后在我们最近的论文中描述的在台阶位点解离。第二个在较高的覆盖率和不可忽略的缺陷密度下占主导地位,服从二阶Langmuir动力学。在此,解离吸附直接发生在横截面为0.24个单元格的台阶部位(台阶密度的初始粘附概率24)。这些结果与热编程解吸数据一致:直接通道负责热解吸光谱中低温峰的出现,通常用1表示,而间接通道则以_2状态表示。这两个通道对氢动能的垂直分量的依赖性明显不同:间接通道显示的幂律行为为指数1.9 0.1,而直接通道则完全不显示垂直能量依赖性。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号