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首页> 外文期刊>The Journal of Chemical Physics >Quantifying electron transfer during hyperthermal scattering of C+60 from Au(111) and n-alkylthiol self-assembled monolayers
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Quantifying electron transfer during hyperthermal scattering of C+60 from Au(111) and n-alkylthiol self-assembled monolayers

机译:量化从Au(111)和正烷基硫醇自组装单层C + 60超热散射过程中的电子转移

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摘要

A tandem time-of-flight mass spectrometer with an intermediate surface was used to quantify electron transfer during glancing incidence scattering of hyperthermal C-60(+) (E-coll=250-500 eV, theta(in)=75 degrees) from (i) self-assembled monolayers of n-alkylthiols on gold (of various chain lengths), (ii) partly fluorinated alkylthiols on gold, as well as (iii) clean gold surfaces. Self-assembled monolayers (SAMs) behave as insulating layers with their thicknesses determining the electron tunneling probability during collision. Correspondingly, a roughly exponential dependence of the neutralization probability on the chain length n was found. A pronounced dependence of the neutral yield on the primary beam kinetic energy indicates that dynamic SAM deformation and associated projectile penetration depth also play a role in determining electron transfer efficiency. Results are consistent with the molecular deformability of SAMs as determined with other experimental methods.
机译:具有中间表面的串联飞行时间质谱仪用于量化在高温下C-60(+)(E-coll = 250-500 eV,theta(in)= 75度)的掠射入射散射过程中的电子转移(i)金(具有各种链长)上的正烷基硫醇的自组装单分子层,(ii)金上的部分氟化烷基硫醇,以及(iii)干净的金表面。自组装单分子层(SAM)充当绝缘层,其厚度决定了碰撞过程中电子隧穿的可能性。相应地,发现了中和概率对链长n的大致指数依赖性。中性屈服强度对一次电子束动能的显着依赖性表明,动态SAM变形和相关的弹丸穿透深度在确定电子传输效率中也起作用。结果与其他实验方法确定的SAMs的分子可变形性一致。

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