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Measurements of the volt-ampere characteristics and the breakdown voltages of direct-current helium and hydrogen discharges in microgaps

机译:微间隙中直流氦和氢放电的伏安特性和击穿电压的测量

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The discharge phenomena for micro meter gap sizes include many interesting problems from engineering and physical perspectives. In this paper, the authors deal with the experimental and theoretical results of the breakdown voltage and current-voltage characteristics of the direct-current helium and hydrogen discharges. The measurements were performed at a constant pressure of around one atmosphere, while varying the gap size between two parallel plane tungsten electrodes between 1 mu m and 100 mu m. From the measured breakdown voltage curves, the effective yields and the ionization coefficients were derived for both gases. Present data for the ionization coefficients correlate with the data obtained for the breakdown voltage curves measured for fixed 100 mu m interelectrode separation. The current-voltage characteristics were plotted for the various gap sizes illustrating the role of the field emission effects in the microgaps. Based on the Fowler-Nordheim theory, the enhancement factors were determined. The gap spacing dependence of the field emission current can be explained by the introduction of two ideas, the first being a space charge effect by emitted electrons, and the second a change in the breakdown mechanism. Experimental results, presented here, demonstrate that Townsend phenomenology breaks down when field emission becomes the key mechanism affecting the breakdown and deforming the left hand side of the breakdown voltage curves. (C) 2014 AIP Publishing LLC.
机译:从工程和物理的角度来看,微米间隙尺寸的放电现象包括许多有趣的问题。在本文中,作者处理直流氦和氢放电的击穿电压和电流-电压特性的实验和理论结果。在大约一个大气压的恒定压力下进行测量,同时在两个平行平面钨电极之间的间隙尺寸在1微米至100微米之间变化。从测得的击穿电压曲线,可以得出两种气体的有效产率和电离系数。电离系数的当前数据与为固定的100μm电极间间距测得的击穿电压曲线的数据相关。绘制了各种间隙尺寸的电流-电压特性,说明了场发射效应在微间隙中的作用。基于Fowler-Nordheim理论,确定了增强因子。场发射电流的间隙间距依赖性可以通过引入两种思想来解释,第一种思想是发射电子的空间电荷效应,第二种思想是击穿机理的改变。此处给出的实验结果表明,当场发射成为影响击穿电压并使击穿电压曲线的左侧变形的关键机制时,汤森德现象学便会崩溃。 (C)2014 AIP Publishing LLC。

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