...
首页> 外文期刊>Physics of plasmas >One-dimensional particle-in-cell simulation on the influence of electron and ion temperature on the sheath expansion process in the post-arc stage of vacuum circuit breaker
【24h】

One-dimensional particle-in-cell simulation on the influence of electron and ion temperature on the sheath expansion process in the post-arc stage of vacuum circuit breaker

机译:电子和离子温度对真空断路器弧后阶段护套扩展过程影响的一维单元内模拟

获取原文
获取原文并翻译 | 示例
           

摘要

The inter-contact region of vacuum circuit breakers is filled with residual plasma at the moment when the current is zero after the burning of metal vapor arc. The residual plasma forms an ion sheath in front of the post-arc cathode. The sheath then expands towards the post-arc anode under the influence of a transient recovery voltage. In this study, a one-dimensional particle-in-cell model is developed to investigate the post-arc sheath expansion. The influence of ion and electron temperatures on the decrease in local plasma density at the post-arc cathode side and post-arc anode side is discussed. When the decay in the local plasma density develops from the cathode and anode sides into the high-density region and merges, the overall plasma density in the inter-contact region begins to decrease. Meanwhile, the ion sheath begins to expand faster. Furthermore, the theory of ion rarefaction wave only explains quantitatively the decrease in the overall plasma density at relatively low ion temperatures. With the increase of ion temperature to certain extent, another possible reason for the decrease in the overall plasma density is proposed and results from the more active thermal diffusion of plasma. (C) 2015 AIP Publishing LLC.
机译:在金属蒸气电弧燃烧后电流为零时,真空断路器的触点间区域充满了残留的等离子体。残留的等离子体在弧后阴极的前面形成离子鞘。然后,在瞬态恢复电压的影响下,护套向弧后阳极膨胀。在这项研究中,开发了一个一维的细胞内颗粒模型来研究弧后鞘的扩张。讨论了离子和电子温度对电弧后阴极侧和电弧后阳极侧局部等离子体密度降低的影响。当局部等离子体密度的衰减从阴极和阳极侧发展到高密度区域并合并时,接触间区域的整体等离子体密度开始下降。同时,离子鞘开始更快地膨胀。此外,离子稀疏波理论仅定量地解释了在相对较低的离子温度下总体等离子体密度的降低。随着离子温度的升高到一定程度,提出了总等离子体密度降低的另一个可能原因,这是由于等离子体更活跃的热扩散所致。 (C)2015 AIP Publishing LLC。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号