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Magnetotransport in the normal state of La1.85Sr0.15Cu1-yZnyO4 films - art. no. 104512

机译:La1.85Sr0.15Cu1-yZnyO4薄膜在正常状态下的磁传输-艺术。没有。 104512

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We have studied the magnetotransport properties in the normal state for a series of La1.85Sr0.15Cu1-yZnyO4 films with values of y between 0 and 0.12. A variable degree of compressive or tensile strain results from the lattice mismatch between the substrate and the film, and affects the transport properties differently from the influence of the zinc impurities. In particular, the orbital magnetoresistance (OMR) varies with y but is strain-independent. The relations for the resistivity (rho=rho(0)+AT) and the Hall angle (cotTheta(H)=alphaT(2)+C), and the proportionality between the OMR and tan(2)Theta(H) (Deltarho/rho=zeta tan(2)Theta(H)) are followed above about 70 K. We have been able to separate the strain and impurity effects by rewriting the last two of these relations as cotTheta(H)/alpha=T-2+C/alpha and Deltarho/rho=(zeta/alpha(2))(alpha(2)tan(2)Theta(H)), where each term is strain-independent and depends on y only. We also find that changes in the lattice constants give rise to approximately the same fractional changes in A, C, and alpha, while rho(0) is, in addition, increased by changes in the microstructure. The OMR is more strongly suppressed by the addition of impurities than tan(2)Theta(H), so that zeta decreases as y increases. We conclude that the relaxation rate that governs the Hall effect is not the same as for the magnetoresistance. We also suggest a correspondence between the transport properties and the opening of the pseudogap at a temperature which changes when the La-Sr ratio changes, but does not change with the addition of the zinc impurities. Several theoretical models seem to be in conflict with our results. Some recent ones may be more compatible, but have not been carried sufficiently far for a detailed comparison. [References: 89]
机译:我们研究了一系列La1.85Sr0.15Cu1-yZnyO4薄膜在正常状态下的磁输运性质,其中y值在0到0.12之间。基板或薄膜之间的晶格失配会导致可变程度的压缩应变或拉伸应变,并且与锌杂质的影响不同,其对传输性能的影响也不同。特别是,轨道磁阻(OMR)随y变化,但与应变无关。电阻率(rho = rho(0)+ AT)和霍尔角(cotTheta(H)= alphaT(2)+ C)的关系以及OMR与tan(2)Theta(H)之间的比例关系(Deltarho / rho = zeta tan(2)Theta(H))在大约70 K以上被跟踪。我们已经能够通过将这些关系的后两个重写为cotTheta(H)/ alpha = T-2来分离应变和杂质效应+ C / alpha和Deltarho / rho =(zeta / alpha(2))(alpha(2)tan(2)Theta(H)),其中每个项与应变无关,并且仅取决于y。我们还发现,晶格常数的变化会导致A,C和α的分数变化大致相同,而rho(0)另外会因微结构的变化而增加。与tan(2)Theta(H)相比,通过添加杂质,OMR受到更强的抑制,因此zeta随着y的增加而减小。我们得出的结论是,控制霍尔效应的弛豫率与磁阻的弛豫率不同。我们还建议在La-Sr比值变化时温度会改变但在锌杂质的添加下不会改变的温度下,传输性能与伪间隙的开口之间存在对应关系。几种理论模型似乎与我们的结果相矛盾。最近的一些兼容性可能更好,但是还没有进行足够的详细比较。 [参考:89]

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