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首页> 外文期刊>Physical Review, B. Condensed Matter >Temperature dependence of the exciton homogeneous linewidth in In0.60Ga0.40As/GaAs self-assembled quantum dots - art. no. 041308
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Temperature dependence of the exciton homogeneous linewidth in In0.60Ga0.40As/GaAs self-assembled quantum dots - art. no. 041308

机译:In0.60Ga0.40As / GaAs自组装量子点中激子同质线宽的温度依赖性-艺术。没有。 041308

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摘要

Single dot photoluminescence spectroscopy was used to study the homogeneous linewidth Gamma of the ground-state exciton in In0.60Ga0.40As/GaAs quantum dots as function of temperature T. In high resolution experiments at 2 K, we find a linewidth that is limited by the excitonic lifetime corresponding to a dephasing time of almost a ns. The approximately linear increase of Gamma with temperature up to similar to30 mueV at 60 K is considerably weaker than in structures of higher dimensionality. For higher T we observe a strong enhancement of the linewidth reaching eventually a few meV at room temperature that depends on the confined electronic shell structure. [References: 24]
机译:使用单点光致发光光谱研究In0.60Ga0.40As / GaAs量子点中基态激子的均匀线宽Gamma与温度T的关系。在2 K的高分辨率实验中,我们发现线宽受到激子寿命对应于相移时间几乎为ns。在60 K下,随着温度升高至接近30 mueV,γ的近似线性增加要比高尺寸结构中的弱得多。对于更高的T,我们观察到线宽的强烈增强,最终在室温下达到几meV,这取决于受限的电子外壳结构。 [参考:24]

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