Anisotropic shape of self-assembled InAs quantum dots: Refraction effect on spot shape of reflection high-energy electron diffraction - art. no. 165307

摘要

A significant role of refraction effect on reflection high-energy electron diffraction (RHEED) from nanostructures is demonstrated. It was found that the chevron-shape spots in RHEED patterns from self-assembled InAs/GaAs(001) and InAs/InAlAs/InP(001) quantum dots at [1 (1) over bar0] azimuth are well reproduced by kinematical calculations taking into account the refraction of electron beam at the curved surfaces of the dots. The dots must have (1 (1) over bar0) cross sections steeper than (110) cross sections and consequently extend along [1 (1) over bar0] since the refraction effects, considerable only at glancing incidence and departure, are invisible at [110] azimuth. [References: 23]