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首页> 外文期刊>Physical Review, B. Condensed Matter >Empirical spds* tight-binding calculation for cubic semiconductors: General method and material parameters
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Empirical spds* tight-binding calculation for cubic semiconductors: General method and material parameters

机译:立方半导体的经验spds *紧密结合计算:通用方法和材料参数

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摘要

An empirical tight-binding method for tetrahedrally coordinated cubic materials is presented and applied to group-IV and III-V semiconductors. The present spds* method extends existing calculations by the inclusion of all five d orbitals per atom in the basis set. On-site energies and two-center integrals between nearest neighbors in the Hamiltonian are fitted to measured energies, pseudopotential results, and the free-electron band structure. We demonstrate excellent agreement with pseudopotential calculations up to about 6 eV above the valence-band maximum even without inclusion of interactions with more distant atoms and three-center integrals. The symmetry character of the Bloch functions at the X point is considerably improved by the inclusion of d orbitals. Density of states, reduced masses, and deformation potentials are correctly reproduced. [References: 46]
机译:提出了一种四面体配位立方材料的经验紧密结合方法,并将其应用于IV和III-V族半导体。本spds *方法通过在基集中包含每个原子所有五个d轨道来扩展现有计算。哈密​​顿量中最接近的邻居之间的现场能量和两个中心积分被拟合为测量的能量,伪势结果和自由电子能带结构。即使在不包含与更远原子和三中心积分的相互作用的情况下,我们也能与价带最大值相比高出约6 eV的伪势计算证明极好的一致性。通过包含d轨道,极大地改善了Bloch函数在X点的对称性。状态密度,减小的质量和变形电位可以正确再现。 [参考:46]

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