Here, we report a measurement scheme for determining an absorption profile with an accuracy imposed solely by photon shot noise. We demonstrate the power of this technique by measuring the absorption of cesium vapor with an uncertainty at the 2-ppm level. This extremely high signal-to-noise ratio allows us to directly observe the homogeneous line-shape component of the spectral profile, even in the presence of Doppler broadening, by measuring the spectral profile at a frequency detuning more than 200 natural linewidths from the line center. We then use this tool to discover an optically induced broadening process that is quite distinct from the well-known power broadening phenomenon.
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