Probing photoelectron multiple interferences via Fourier spectroscopy in energeticphotoionization of Xe @ C_(60)

摘要

Considering the photoionization of the Xe@C_(60) endohedral compound, we study in detail the ionization cross sections of various levels of the system at energies higher than the plasmon resonance region. Five classes of single-electron levels are identified depending on their spectral character. Each class engenders distinct oscillations in the cross section, emerging from the interference between active ionization modes specific to that class. Analysis of the cross sections based on their Fourier transforms unravels oscillation frequencies that carry unique fingerprints of the emitting level.