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首页> 外文期刊>Physical Review, A. Atomic, molecular, and optical physics >Single, double, and triple Auger decay of the Xe 4p core-hole states
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Single, double, and triple Auger decay of the Xe 4p core-hole states

机译:Xe 4p核孔态的单,双和三重俄歇衰减

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摘要

Auger decay of Xe+ states arising from 4p ionization has been studied with a very efficient multielectron coincidence method. Coster-Kronig decay from Xe+ 4p(-1) and the subsequent decay into Xe3+ states with three valence holes are identified. Formation of Xe4+ is also observed as quadruple coincidences between a 4p photoelectron and three Auger electrons. The relative probabilities of individual multi-ionization processes are determined from the coincidence yields.
机译:已经用一种非常有效的多电子符合方法研究了由4p电离引起的Xe +态的俄歇衰变。确定了从Xe + 4p(-1)开始的Coster-Kronig衰减以及随后的衰减到具有三个价孔的Xe3 +态。 Xe4 +的形成还被观察为4p光电子与三个俄歇电子之间的四重巧合。各个多重电离过程的相对概率由重合产率确定。

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