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首页> 外文期刊>Physics Letters, A >Linewidth measurement of Littrow structure semiconductor laser with improved methods
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Linewidth measurement of Littrow structure semiconductor laser with improved methods

机译:改进方法测量Littrow结构半导体激光器的线宽

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摘要

In this Letter, the frequency noise spectrum is analyzed in the experiment of the laser linewidth measurement. The power spectrum of three most widely used laser linewidth measurement methods, i.e., the heterodyne measurement, the self-homodyne measurement and the self-heterodyne measurement, are restudied both theoretically and experimentally. A scheme adopting an avalanche photodetector (APD) in the delayed self-heterodyne (DSHT) method is proposed, and an indirect determined result is given. Crown Copyright (C) 2008 Published by Elsevier B.V. All rights reserved.
机译:在这封信中,在激光线宽测量的实验中分析了频率噪声频谱。从理论上和实验上重新研究了三种最广泛使用的激光线宽测量方法的功率谱,即外差测量,自同调测量和自外差测量。提出了在延迟自外差(DSHT)方法中采用雪崩光电探测器(APD)的方案,并给出了间接确定的结果。 Crown版权所有(C)2008,Elsevier B.V.保留所有权利。

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