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AC losses and transverse resistivity in filamentary MgB_2 tape with Ti barriers

机译:带Ti阻挡层的MgB_2丝状带的交流损耗和横向电阻率

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摘要

We measured and analyzed AC losses of MgB_2 tape with 19 filaments surrounded by Ti barriers and embedded in copper stabilization, exposed to external magnetic field with frequencies from 30 mHz up to 1.4 Hz and amplitudes up to 0.8 T at 4.2 K. Using the measured frequency dependence of the total AC losses we determined the contribution of hysteresis and coupling losses. The transverse resistivity determined from the coupling losses is considerably higher than that corresponding to the resistivity of copper stabilization before the tape processing due to diffusion of Ti. From the measured penetration field critical current densities were determined using results of theories for circular as well as rectangular filaments.
机译:我们测量并分析了MgB_2胶带的AC损耗,该MgB_2胶带具有19根被Ti势垒包围并嵌入铜稳定层的细丝,暴露于外部磁场中,其频率从30 mHz到1.4 Hz,在4.2 K时振幅高达0.8T。取决于总交流损耗,我们确定了磁滞和耦合损耗的贡献。由耦合损耗确定的横向电阻率明显高于在带处理之前由于Ti的扩散而导致的铜稳定电阻率。根据测得的穿透场,使用圆形和矩形灯丝的理论结果确定临界电流密度。

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