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The assessment of pore connectivity in hierarchical zeolites using positron annihilation lifetime spectroscopy: instrumental and morphological aspects

机译:使用正电子an没寿命光谱技术评估分级沸石中的孔连通性:仪器和形态学方面

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摘要

Recent studies demonstrated the power of positron annihilation lifetime spectroscopy (PALS) to characterise the connectivity and corresponding effectiveness of hierarchical pore networks in zeolites. This was based on the fractional escape of ortho-positronium (Ps), formed within the micropore framework, to vacuum. To further develop this technique, here we assess the impact of the positron implantation energy and of the zeolite crystal size and the particle morphology. Conventional measurements using fast positrons and beam measurements applying moderated positrons both readily distinguish purely microporous ZSM-5 zeolites comprised of single crystals or crystal aggregates. Unlike beam measurements, however, conventional measurements fail to discriminate model hierarchical zeolites with open or constricted mesopore architectures. Several steps are taken to rationalise these observations. The dominant contribution of Ps diffusion to the PALS response is confirmed by capping the external surface of the zeolite crystals with tetraethylorthosilicate, which greatly enhances the sensitivity to the micropore network. A one-dimensional model is constructed to predict the out-diffusion of Ps from a zeolite crystal, which is validated experimentally by comparing coffin-shaped single crystals of varying size. Calculation of the trends expected on the application of fast or moderated positrons indicates that the distinctions in the initial distribution of Ps at the crystal level cannot explain the limited sensitivity of the former to the mesopore architecture. Instead, we propose that the greater penetration of fast positrons within the sample increases the probability of Ps re-entry from intercrystalline voids into mesopores connected with the external surface of zeolite crystals, thereby reducing their fractional escape.
机译:最近的研究表明,正电子lifetime灭寿命谱(PALS)能够表征分子筛中的孔隙网络的连通性和相应有效性。这是基于在微孔框架内形成的邻位正电子(Ps)逃逸至真空的分数。为了进一步开发该技术,在这里我们评估正电子注入能量以及沸石晶体尺寸和颗粒形态的影响。使用快速正电子的常规测量和使用中度正电子的束测量都可以轻松地区分由单晶或晶体聚集体组成的纯微孔ZSM-5沸石。然而,与束测量不同,常规测量无法区分具有开放或受限的中孔结构的模型分层沸石。采取了一些步骤来合理化这些观察结果。通过用原硅酸四乙酯封盖沸石晶体的外表面,可以证实Ps扩散对PALS反应的主要贡献,这大大提高了对微孔网络的敏感性。构建一维模型以预测Ps从沸石晶体中的扩散,该模型通过比较大小不同的棺材形单晶进行了实验验证。对使用快速或中度正电子的预期趋势的计算表明,在晶体水平上Ps初始分布的差异不能解释前者对介孔结构的有限敏感性。取而代之的是,我们提出样品中快速正电子的更大渗透增加了Ps从晶间空隙重新进入与沸石晶体外表面相连的介孔的可能性,从而减少了分数逸出。

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