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Cross-sectional shape evaluation of a particle by scatterometry

机译:通过散射法评估颗粒的截面形状

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Reconstructing an image from the scattering pattern of particles with several wavelengths is difficult. This is because precise calculation in such cases is difficult, and because there is no proper procedure to evaluate shapes from the scattering pattern. We use rigorous coupled-wave analysis (RCWA), which we previously developed and applied to an isolated scatterer, and rotate the particle to reconstruct the image. We find that it is possible to discriminate between rectangles, triangles, and squares. The precision of length can be less than 0.2 of the wavelength, provided that the refractive index of the scatterer is known. (C) 2015 Elsevier B.V. All rights reserved.
机译:从具有几种波长的粒子的散射图案重建图像是困难的。这是因为在这种情况下难以进行精确计算,并且因为没有适当的程序来根据散射图案评估形状。我们使用严格的耦合波分析(RCWA),它是我们先前开发并应用于孤立的散射体的,然后旋转粒子以重建图像。我们发现可以区分矩形,三角形和正方形。如果已知散射体的折射率,则长度的精度可以小于波长的0.2。 (C)2015 Elsevier B.V.保留所有权利。

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