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Principal component analysis based simultaneous dual-wavelength phase-shifting interferometry

机译:基于主成分分析的同步双波长相移干涉仪

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摘要

Combing a sequence of simultaneous phase-shifting dual-wavelength interferograms (SPSDWIs) and principal component analysis (PCA) algorithm, we propose a novel phase retrieval approach in dual-wavelength interferometry. Firstly, for each wavelength, two mutually orthogonal principal component maps are constructed from a sequence of SPSDWIs through using the PCA algorithm, in which SPSDWIs are captured using a monochrome CCD and random and unknown phase shifts. Subsequently, the wrapped phases of each wavelength are obtained directly from the two orthogonal maps by performing the arctangent operation. Finally, an unambiguous phase of an extended synthetic beat wavelength is determined by a simple subtraction between these two wrapped phases. Both, the simulation and the experimental results demonstrate that the proposed approach reveals the simple and convenient performance, faster computing speed and good accuracy. (C) 2014 Elsevier B.V. All rights reserved.
机译:结合一系列同时相移双波长干涉图(SP​​SDWI)和主成分分析(PCA)算法,我们提出了一种新的双波长干涉测量中的相位检索方法。首先,对于每个波长,通过使用PCA算法从SPSDWI序列中构造两个相互正交的主成分图,其中使用单色CCD以及随机和未知相移捕获SPSDWI。随后,通过执行反正切运算,直接从两个正交图获得每个波长的包裹相位。最后,通过在这两个包裹相位之间进行简单相减来确定扩展合成拍频波长的明确相位。仿真和实验结果均表明,该方法具有简单方便,运算速度快,精度高等优点。 (C)2014 Elsevier B.V.保留所有权利。

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