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Is MoS_2 a robust material for 2D electronics?

机译:MoS_2是2D电子产品的坚固材料吗?

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摘要

A nanoindentation computer experiment has been carried out by means of Born–Oppenheimer molecular-dynamics simulations employing the density-functional based tight-binding method. A free-standing MoS_2 sheet, fixed at a circular support, was indented by a stiff, sharp tip. During this process, the strain on the nanolayer is locally different, with maximum values in the vicinity of the tip. All studied electronic properties-the band gap, the projected density of states, the atomic charges and the quantum conductance through the layer-vary only slightly before they change significantly when the MoS_2 sheet finally is pierced. After strong local deformation due to the indentation process, the electronic conductance in our model still is 80% of its original value. Thus, the electronic structure of single-layer MoS_2 is rather robust upon local deformation.
机译:纳米压痕计算机实验已经通过使用基于密度泛函的紧密结合方法的Born-Oppenheimer分子动力学模拟进行了。固定在圆形支架上的独立MoS_2薄板被坚硬,尖锐的尖端压入。在此过程中,纳米层上的应变局部不同,最大值在尖端附近。所有研究的电子性质-带隙,状态的预计密度,穿过层的原子电荷和量子电导-在MoS_2片最终被刺穿之前,在它们发生显着变化之前仅稍有变化。由于压痕过程导致局部强烈变形后,我们模型中的电子电导仍然是其原始值的80%。因此,单层MoS_2的电子结构在局部变形时相当坚固。

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