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首页> 外文期刊>Microwave and optical technology letters >A REMOTELY INTERROGATED NEAR-FIELD SENSOR FOR SUB-lambda MICROWAVE IMAGING
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A REMOTELY INTERROGATED NEAR-FIELD SENSOR FOR SUB-lambda MICROWAVE IMAGING

机译:用于亚λ微波成像的遥测近场传感器

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摘要

A wideband surface-scanning near-field sensor in the form of a slot antenna, remotely interrogated by a wireless signal is reported. Perturbation of the antenna near-field by subwavelength objects (lambda/10) on the surface is detected in the far-field as a change in the antenna signature, yielding image of the surface structure. (C) 2016 Wiley Periodicals, Inc.
机译:据报道,缝隙天线形式的宽带表面扫描近场传感器受到无线信号的远程询问。在远场中检测到表面近亚波长物体(λ/ 10)对天线近场的干扰,这是天线特征的变化,从而产生了表面结构的图像。 (C)2016威利期刊公司

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