首页> 外文期刊>Electrochimica Acta >Surface immobilisation of transition metal substituted Krebs type polyoxometalates, [X_2W_(20)M_2O_(70)(H_2O)_6]~(n-) (X= Bi or Sb, M = Co~(2+) or Cu~(2+)), by the layer by layer technique
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Surface immobilisation of transition metal substituted Krebs type polyoxometalates, [X_2W_(20)M_2O_(70)(H_2O)_6]~(n-) (X= Bi or Sb, M = Co~(2+) or Cu~(2+)), by the layer by layer technique

机译:过渡金属取代的Krebs型多金属氧酸盐[X_2W_(20)M_2O_(70)(H_2O)_6]〜(n-)(X = Bi或Sb,M = Co〜(2+)或Cu〜(2+ )),逐层技术

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摘要

A series of transition metal (i.e. Cu~(2+) and Co~(2+)) substituted Krebs type polyoxometalates (POMs), of the general formula [X_2W_(20)M_2O_(70)(H_2O)_6]~(n-), X=Sb or Bi, M=Co(II) or Cu(II), have been successfully immobilised onto carbon electrode surfaces through the employment of the layer-by-layer (LBL) technique. This involved the construction of alternating anionic POM, [X_2W_(20)M_2O_(70)(H_2O)_6]~(n-), layers and the cationic metallodendrimer, Ru(II)-metallodendrimer as the cationic layers, in addition to a [poly(diallyldimethylammonium chloride)] PDDA base layer. Stable multielectron redox couples associated with the W-O framework, for the Krebs type POMs, and the Ru(III/II) for the metallodendrimer, were clearly observed upon layer construction and redox switching within the pH domain of 2-6.5. The constructed multilayer assemblies exhibited pH dependent redox activity and thin layer behaviour up to 100 mVs~(-1). The porosity and permeability of the individual multilayer assemblies towards an anionic probe were determined by AC impedance and cyclic voltammetry. The surface morphology of each multilayer was also determined by Atomic Force Microscopy (AFM).
机译:一系列由通式[X_2W_(20)M_2O_(70)(H_2O)_6]〜(n -),X = Sb或Bi,M = Co(II)或Cu(II),已通过采用逐层(LBL)技术成功固定在碳电极表面上。这涉及交替的阴离子POM,[X_2W_(20)M_2O_(70)(H_2O)_6]〜(n-),层和阳离子金属树状大分​​子Ru(II)-金属树状大分​​子作为阳离子层的构建。 [聚(二烯丙基二甲基氯化铵)] PDDA基础层。在2-6.5的pH域内进行层构建和氧化还原转换后,可以清楚地观察到与W-O框架相关的稳定的多电子氧化还原对(对于Krebs型POM)以及对于金属树状大分​​子的Ru(III / II)。所构建的多层组件表现出pH依赖性的氧化还原活性和高达100 mVs〜(-1)的薄层行为。通过交流阻抗和循环伏安法确定单个多层组件对阴离子探针的孔隙率和渗透率。还通过原子力显微镜(AFM)确定每个多层的表面形态。

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