首页> 外文期刊>Colloid journal >Defect structure of nanosized mechanically activated MoO3
【24h】

Defect structure of nanosized mechanically activated MoO3

机译:纳米机械活化的MoO3的缺陷结构

获取原文
获取原文并翻译 | 示例
           

摘要

Defect structure of mechanically activated MoO3 has been studied with the use of X-ray diffraction, Raman spectroscopy, electron paramagnetic resonance, laser granulometry, and adsorption methods. Two stages of mechanical activation have been distinguished. At mechanical activation doses below 1 kJ/g, the fracture of oxide particles is the main process. At this stage, MoO3 particle sizes decrease from 30 mu m to 60 nm and specific surface area linearly increases to 30 m(2)/g, the sizes of coherent-scattering regions decrease to 18 nm, paramagnetic centers are accumulated, and the Raman spectral bands corresponding to three different types of Mo-O bonds widen and shift. At doses above 1 kJ/g, the main process consists in the friction and aggregation of particles, which is accompanied by some reduction in the specific surface area and an increase in the particle sizes. At the stage of friction, the phase transition from an orthorhombic modification to a monoclinic modification of MoO3 occurs seemingly due to a shift of one layer of the material in plane (100). The shift is accompanied by the accumulation of lattice microstrains in the same plane, formation of "stressed" Mo-O-Mo bridge bonds, and a substantial rise in the concentration of Mo5+ radicals. The maximum total concentration of paramagnetic centers is 1 x 10(18) g(-1). It may be assumed that the radicals are formed due to the rupture of the most stressed molybdenum-oxygen bridge bonds.
机译:利用X射线衍射,拉曼光谱,电子顺磁共振,激光粒度分析和吸附方法研究了机械活化的MoO3的缺陷结构。机械激活分为两个阶段。在低于1 kJ / g的机械活化剂量下,氧化物颗粒的破裂是主要过程。在此阶段,MoO3的粒径从30μm减小到60 nm,比表面积线性增加到30 m(2)/ g,相干散射区的尺寸减小到18 nm,顺磁中心积累,拉曼光谱与三种不同类型的Mo-O键相对应的光谱带变宽并移动。在高于1 kJ / g的剂量下,主要过程包括颗粒的摩擦和聚集,这伴随着比表面积的某些减小和粒径的增加。在摩擦阶段,MoO3从斜方晶型到单斜晶型的相变似乎是由于一层材料在平面(100)中的移动而发生的。该移动伴随着晶格微应变在同一平面上的积累,“受应力的” Mo-O-Mo桥键的形成以及Mo5 +自由基浓度的显着提高。顺磁中心的最大总浓度为1 x 10(18)g(-1)。可以假定自由基是由于最受应力的钼-氧桥键的断裂而形成的。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号