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Frequency domain phase noise analysis of dual injection-locked optoelectronic oscillators

机译:双注入锁定光电振荡器的频域相位噪声分析

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Dual injection-locked optoelectronic oscillators (DIL-OEOs) have been introduced as a means to achieve very low-noise microwave oscillations while avoiding the large spurious peaks that occur in the phase noise of the conventional single-loop OEOs. In these systems, two OEOs are inter-injection locked to each other. The OEO with the longer optical fiber delay line is called the master OEO, and the other is called the slave OEO. Here, a frequency domain approach for simulating the phase noise spectrum of each of the OEOs in a DIL-OEO system and based on the conversion matrix approach is presented. The validity of the new approach is verified by comparing its results with previously published data in the literature. In the new approach, first, in each of the master or slave OEOs, the power spectral densities (PSDs) of two white and 1/f noise sources are optimized such that the resulting simulated phase noise of any of the master or slave OEOs in the free-running state matches the measured phase noise of that OEO. After that, the proposed approach is able to simulate the phase noise PSD of both OEOs at the injection-locked state. Because of the short run-time requirements, especially compared to previously proposed time domain approaches, the new approach is suitable for optimizing the power injection ratios (PIRs), and potentially other circuit parameters, in order to achieve good performance regarding the phase noise in each of the OEOs. Through various numerical simulations, the optimum PIRs for achieving good phase noise performance are presented and discussed; they are in agreement with the previously published results. This further verifies the applicability of the new approach. Moreover, some other interesting results regarding the spur levels are also presented. (C) 2016 Optical Society of America
机译:引入双注入锁定光电振荡器(DIL-OEO)作为一种实现非常低噪声的微波振荡的方法,同时又避免了传统单环OEO的相位噪声中出现的大杂散峰。在这些系统中,两个OEO相互注入锁定。具有较长光纤延迟线的OEO称为主OEO,另一个称为从OOE。在此,提出了一种用于模拟DIL-OEO系统中每个OEO的相位噪声谱并基于转换矩阵方法的频域方法。通过将其结果与文献中先前发布的数据进行比较,可以验证新方法的有效性。在新方法中,首先,在每个主OOE或从属OEO中,优化两个白色和1 / f噪声源的功率谱密度(PSD),以使任何主OOE或从OOE中产生的模拟相位噪声在自由运行状态与该OEO的测得相位噪声匹配。之后,所提出的方法能够在注入锁定状态下模拟两个OEO的相位噪声PSD。由于运行时间要求短,尤其是与先前提出的时域方法相比,新方法适合于优化功率注入比(PIR)和潜在的其他电路参数,以实现有关相位噪声的良好性能。每个OEO。通过各种数值模拟,提出并讨论了实现良好相位噪声性能的最佳PIR。它们与先前发布的结果一致。这进一步验证了新方法的适用性。此外,还提出了一些有关支线水平的有趣结果。 (C)2016美国眼镜学会

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