In recent years, there has been a mounting interest in better methods of measuring nanoscale objects, especially in fields such as nanotechnology, biomedicine, cleantech, and microelectronics. Conventional methods have proved insufficient, due to the classical diffraction limit or slow and complicated measuring procedures. The purpose of this paper is to explore the special characteristics of singular beams with respect to the investigation of subwavelength objects. Singular beams are light beams that contain one or more singularities in their physical parameters, such as phase or polarization. We focus on the three-dimensional interaction between electromagnetic waves and subwavelength objects to extract information about the object from the scattered light patterns.
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