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Far-field condition for light-emitting diode arrays

机译:发光二极管阵列的远场条件

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摘要

In practice, any cluster of light-emitting diodes (LEDs) can be modeled or measured as a directional point source if the detector is far enough away from the cluster. We propose a far-zone condition for measuring or modeling propagation of light from an LED array. An equation gives the far-field distance as a function of the LED radiation pattern, array geometry, and number of LEDs. The far field is shorter for high packaging density clusters, and the far field considerably increases with increasing beam directionality of LEDs. In contrast with the classical rule of thumb (5 times the source size), the near zone of an array with highly directional LEDs can extend to more than 60 times the array size. We also analyze the effect of introducing random variations of light flux among LEDs of the array, which shows that far-field variability is low in high packaging density arrays.
机译:实际上,如果检测器离发光二极管(LED)足够远,则可以将其建模或测量为定向点源。我们提出了一种用于测量或建模来自LED阵列的光的传播的远区条件。方程式给出了远场距离与LED辐射方向图,阵列几何形状和LED数量的关系。对于高封装密度的簇,远场较短,并且随着LED光束方向性的提高,远场会显着增加。与传统的经验法则(光源尺寸的5倍)相比,带有高度定向LED的阵列的近区可以扩展到阵列尺寸的60倍以上。我们还分析了在阵列的LED之间引入光通量随机变化的影响,这表明高封装密度阵列中的远场变化性较低。

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