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Ion Mobility Spectrometry for Monitoring High-Purity Oxygen

机译:离子迁移谱法监测高纯氧

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The ability of the ion mobility spectrometry (IMS) technique with a negative corona discharge (CD) ion source to detect trace amounts of impurities in high-purity O_(2) has been explored. The processes of the formation of negative ions in negative CD IMS have been studied using the ion mobility spectrometry/mass spectrometry (IMS/MS) technique. The CD IMS and CD IMS/MS spectra of 5.0 and 6.0 oxygen with and without additional purification (CO_(2) and H_(2)O removal) have been measured. It has been proven that the trace amounts of N_(2) in high-purity O_(2) can be monitored using the CD IMS and/or CD IMS/MS technique.
机译:研究了具有负电晕放电(CD)离子源的离子迁移谱(IMS)技术检测高纯O_(2)中痕量杂质的能力。已经使用离子迁移谱/质谱(IMS / MS)技术研究了在负CD IMS中形成负离子的过程。已经测量了有和没有额外纯化(去除CO_(2)和H_(2)O)的5.0和6.0氧气的CD IMS和CD IMS / MS光谱。已经证明,可以使用CD IMS和/或CD IMS / MS技术监测高纯度O_(2)中的痕量N_(2)。

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