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Implications of Marcus-Hush Theory for Steady-State Heterogeneous Electron Transfer at an Inlaid Disk Electrode

机译:Marcus-Hush理论对镶嵌圆盘电极上稳态非均相电子转移的启示

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For an outer-sphere heterogeneous electron transfer, Ox + e velence Red, between an electrode and a redox couple, the Butler-Volmer formalism predicts that the operative heterogeneous rate constant, k_(red) (cm s~(-1)) for reduction (or k_(ox) for oxidation) increases without limit as an exponential function of -alpha (E - E~(0)) for reduction (or (1 - alpha)(E - E~(0)) for oxidation), where E is the applied electrode potential, alpha (approx1/2) is the transfer coefficient and E~(0) is the formal potential. The Marcus-Hush formalism, as exposited by Chidsey (Chidsey, C. E. D. Science 1991, 215, 919), predicts that the value of k_(red) or k_(ox) limits at sufficiently large values of -(E - E~(0)) or (E - E~(0)). The steady-state currents at an inlaid disk electrode obtained for a redox species in solution were computed using both formalisms with the Oldham-Zoski approximation (Oldham, K. B.; Zoski, C. G. J. Electroanal. Chem. 1988, 256, 11). Significant differences are noted for the two formalisms. When k~(0)r_(0)/D is sufficiently small (k~(0) is the standard rate constant, r_(0) is the radius of the disk electrode, and D is the diffusion coefficient of the redox species), the Marcus-Hush formalism effects a limiting current that can be significantly smaller than the mass transport limited current. This is easily explained in terms of the limiting values of k_(red) and k_(ox) predicted by the Marcus-Hush formalism. The experimental conditions that must be met to effect significant differences in behavior are discussed; experimental conditions that effect virtually identical behavior are also discussed. As a caveat for experimentalists, applications of the Butler-Volmer formalism to systems that are more properly described using the Marcus-Hush formalism are shown to yield incorrect values of k~(0) and meaningless values of alpha, which serves only as a fitting parameter.
机译:对于电极和氧化还原对之间的外层非均质电子转移Ox + evelence Red,Butler-Volmer形式主义预测,对于以下条件,有效非均质速率常数k_(red)(cm s〜(-1))还原(或k_(ox)用于氧化)无限制地增加-α(E-E〜(0))用于还原(或(1-α)(E-E〜(0))的指数函数) ,其中E是施加的电极电位,α(大约1/2)是转移系数,E〜(0)是形式电位。由Chidsey(Chidsey,CED Science 1991,215,919)解释的Marcus-Hush形式主义预测k_(red)或k_(ox)的值限制在-(E-E〜(0 ))或(E-E〜(0))。使用两种形式的Oldham-Zoski近似值(Oldham,K.B .; Zoski,C.G.J.Electroanal.Chem.1988,256,11)计算溶液中氧化还原物质所获得的镶嵌圆盘电极处的稳态电流。注意到两种形式主义之间的显着差异。当k〜(0)r_(0)/ D足够小时(k〜(0)是标准速率常数,r_(0)是圆盘电极的半径,D是氧化还原物质的扩散系数) ,Marcus-Hush形式主义产生的极限电流可能大大小于大众运输的极限电流。这很容易用Marcus-Hush形式主义预测的k_(red)和k_(ox)的极限值来解释。讨论了在行为上产生显着差异所必须满足的实验条件;还讨论了影响几乎相同行为的实验条件。作为对实验人员的警告,Butler-Volmer形式主义在使用Marcus-Hush形式主义更恰当地描述的系统上的应用显示产生不正确的k〜(0)值和无意义的alpha值,这仅作为拟合参数。

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