X-ray Spectrometry

摘要

In this review, we focus on the most significant and essential progress in X-ray spectrometry (XRS) published during the period 2008-2009 covering developments and improvements in X-ray optics, X-ray detectors, new quantification models in X-ray spectra and data evaluation, micro-X-ray fluorescence (mu-XRF) including 3D-X-ray fluorescence (3D-XRF), imaging techniques such as tomography and holography methods for 2D or 3D imaging of microstructures, electron probe microanalysis (EPMA), total reflection X-ray fluorescence (TXRF), particle-induced X-ray emission (PIXE) analysis, and X-ray absorption spectrometry (XAS). In addition, different applications in each subfield of XRS are described including sample preparation, standard materials, energy-dispersive XRF (ED-XRF), and wavelength-dispersive XRF (WD-XRF). This review involves only a selected minority of published papers and impressive figures. We attempt to look over the current trends in this analytical field with a critically selected citing of papers to support the research activity of the community of X-ray scientists.