X-ray Spectrometry

摘要

In this review, we focus on the most significant and essential progress in X-ray spectrometry (XRS) published during the period 2006-2007 covering the following topics: developments and improvements in the detection performance and instrumentation of X-ray techniques and X-ray optics, new quantification models in X-ray spectra and data evaluation, micro-X-ray fluorescence (mu-XRF) including 3D-XRF, imaging techniques such as tomography and holography methods for 2D or 3D imaging of microstructures, electron probe microanalysis (EPMA), total reflection X-ray fluorescence (TXRF), particle-induced X-ray emission (PIXE) analysis, and X-ray absorption spectrometry (XAS). Finally, different applications in each subfield of XRS are described. Since the previous review, the sections of mu-XRF and 3D-XRF are newly introduced. An international group of scientists published two overviews on XRS (1, 2) in the Journal of Analytical Atomic Spectrometry covering the period 2006-2007 in the principal field of XRS analytical spectroscopic methods and instruments. These review articles involve all the important sections of XRS in nine chapters: reviews, instrumentation, spectrum analysis, matrix correction and calibration, X-ray optics and microfluorescence, synchrotron radiation, TXRF, portable and mobile X-ray fluorescence (XRF), and online XRF and applications. In the present review, we use a different method of classifying the information published in the literature during the 2006-2007 period: detection, instrumentation (except detectors) and optics, quantification models and related fundamental data, tomography and holography methods as primary tools of X-ray imaging, TXRF, EPMA, PIXE, XAS, and a final chapter that reviews the application of these methods in geology, environmental research, industry, biology, and medicine.