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Cast studies of electronic equipment reliability prediction - comparison between MIL-HDBK-217F and Bellcore TR-332

机译:电子设备可靠性预测的铸造研究-MIL-HDBK-217F与Bellcore TR-332的比较

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摘要

MIL-IIDBK-217F has been widely used not only in Japan but also around the world as the most authorized method for reliability prediction of electronic equipments. It is noted that many reliability engineers have preferred Bellcore reliability prediction method TR-332 to 217F, because the predicted values with 2 17F do not always reflect the values observed in the actual field. First, this report makes a comparison between the numerical values of the generic failure rate of various electronic parts based on the two reliability prediction methods. Next, it deals with the case studies of the reliability prediction for two main units of electronic private branch exchange manufactured by TOA Corporation; one is a control unit, the other a power supply unit. Finally, it compares the MTBF values of these two units calculated by 217F with those by TR-332.
机译:MIL-IIDBK-217F作为电子设备可靠性预测的最权威方法,不仅在日本而且在全世界都得到了广泛使用。注意,许多可靠性工程师更喜欢Bellcore可靠性预测方法TR-332至217F,因为2 17F的预测值并不总是反映实际现场中观察到的值。首先,本报告基于两种可靠性预测方法对各种电子零件的通用故障率数值进行了比较。接下来,将讨论由TOA Corporation制造的两个主要的电子专用小交换机的可靠性预测的案例研究;一个是控制单元,另一个是电源单元。最后,它将217F和TR-332计算出的这两个单位的MTBF值进行比较。

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