A Metallic Nano-Cluster at a Tip Apex Applied to Field-Sensitive Measurements

摘要

This article reports on the fabrication of field-sensitive probes and the related applications. Using an atomic force microscope combined with electrochemical reaction mechanism, a metallic nano-cluster can be formed at the tip apex. The recipe of the electrolyte solution determined the material of the metallic nano-clusters. Using this probe engineering technique, one can fabricate a metallic nano-cluster with a diameter of about 15 nm. The metallic nano-cluster could suppress the stray field effect and improve the spatial resolution of field-sensitive scanning probe microscopy (FS-SPM). Furthermore, experimental results revealed that laser annealing following the process of the metallic nano-cluster tip can enhance the signals and improve the image quality of FS-SPM.