New Generation Imaging Technique of Atomic Force Microscope - PeakForce Tapping Mode and Relative Deviated Mode

摘要

Using PeakForce Tapping could improve the drawback of the traditional AFM technique. In this article, we will explain how PeakForce tapping provides not only rapid quantitative nano-mechanics mapping but also automated feedback optimization of AFM imaging. This new technique is compatible with C-AFM and KPFM, and gains both of mechanics and electrical information in high spatial resolution simultaneously.