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首页> 外文期刊>Computational Materials Science >Acceptor and donor ionization energy levels in O-doped ZnTe
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Acceptor and donor ionization energy levels in O-doped ZnTe

机译:O掺杂ZnTe中的受主和施主电离能级

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The O-doped ZnTe (ZnTe_(1-x)O_x) alloys present induce levels through O doping into the host semiconductor gap. ZnTe usually crystallizes in the zinc-blend structure and ZnO in the wurtzite structure under normal conditions. Therefore two possible ZnTe_(1-)_xO_x phases may coexist, although in different proportions, depending on experimental growth conditions. We present total energy calculations and analyze some of their electronic properties with respect to: the two ordered wurtzite and zinc-blende structures, the concentration (x from 0.0078 to 0.5), the localized basis set (from single-zeta to quadruple-zeta with polarization basis sets), and the variation of the ionization levels with x and with the distance O-Zn.
机译:掺杂O的ZnTe(ZnTe_(1-x)O_x)合金通过将O掺杂到主体半导体间隙中而引起能级。在正常条件下,ZnTe通常在锌混合结构中结晶,而ZnO在纤锌矿结构中结晶。因此,根据实验的生长条件,虽然比例不同,但可能会共存两个可能的ZnTe_(1-)_ xO_x相。我们提出了总能量计算,并针对以下两个方面分析了它们的一些电子性能:两种有序纤锌矿和闪锌矿结构,浓度(x从0.0078到0.5),局部基集(从单峰到四峰,极化基集),以及电离水平随x和距离O-Zn的变化。

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