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An Investigation for the Method of Lifetime Prediction of Ag-Ni Contacts for Electromagnetic Contactor

机译:电磁接触器Ag-Ni触头寿命预测方法的研究

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Electrical contacts are widely used for telecommunication and electric power systems as a device mechanically making and breaking electrical current. In the future, they will be more indispensable. In this paper, we explored the possibilities of early lifetime prediction of Ag-Ni contacts for an electromagnetic contactor. Contact erosion often leads to the contact failure and the system fault. Especially, for heavy electrical systems, the failure can cause critical troubles. We must estimate approximate periods of the system fault to avoid the troubles. The tests of lifetime are very important for that purpose. However, the tests often require enormous amount of time. We investigate the possibilities of lifetime prediction of contacts. In the past work, we confirmed that the mass loss could lead to the contact failure of Ag-Ni contacts and the mass loss of cathode was in proportion to total arc energy generated between the anode and the cathode. At this time we measured the mass losses of cathodes with a few making and breaking operations for more samples, and accurately predicted the mass losses after a lot of operations. We compared them with experimented results of a lot of operations.
机译:电触头作为一种机械地产生和断开电流的装置,广泛用于电信和电力系统。将来,它们将是必不可少的。在本文中,我们探索了用于电磁接触器的Ag-Ni触点的早期寿命预测的可能性。接触腐蚀经常导致接触故障和系统故障。特别是对于重型电气系统,故障可能会导致严重故障。我们必须估计系统故障的大概时间,以免造成麻烦。为此,寿命测试非常重要。但是,测试通常需要大量时间。我们调查联系人的寿命预测的可能性。在过去的工作中,我们确认质量损失可能导致Ag-Ni触点的接触失败,并且阴极的质量损失与阳极和阴极之间产生的总电弧能成比例。此时,我们通过几次制造和破坏操作来测量更多样品的阴极质量损失,并准确预测了许多操作后的质量损失。我们将它们与许多操作的实验结果进行了比较。

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