...
首页> 外文期刊>Computational Materials Science >Topological electronic states of bismuth selenide thin films upon structural surface defects
【24h】

Topological electronic states of bismuth selenide thin films upon structural surface defects

机译:结构表面缺陷对硒化铋薄膜的拓扑电子态

获取原文
获取原文并翻译 | 示例
   

获取外文期刊封面封底 >>

       

摘要

A noticeable effort has been put into developing a consistent understanding of surface electronic structure of topological insulators. Of special interest has been a fundamental feature of their surface electronic states being insensitive to various types of defects and distortions. In the following paper, based on the density functional theory calculations, these topological states are investigated in asymmetric thin films of bismuth selenide with one surface modified by structural distortions. It is shown that the energetics and spatial localisation of the topological electronic states on the modified surface of the film evolve drastically as a consequence of their topological dangling bond nature. It is also shown that all the asymmetric slabs exhibit suppression of the thin film size effect and restoration of massless Dirac electrons on the undistorted surface of the film. The results are relevant for effective band gap engineering in thin films of topological insulators by means of chemical or physical functionalisation. (C) 2016 Elsevier B.V. All rights reserved.
机译:在建立对拓扑绝缘子的表面电子结构的一致理解方面已经付出了显着的努力。特别令人关注的是其表面电子状态对各种类型的缺陷和变形不敏感的基本特征。在接下来的论文中,基于密度泛函理论计算,研究了一种表面结构变形修饰的硒化铋不对称薄膜中的这些拓扑状态。结果表明,由于电子的拓扑悬挂键性质,在薄膜改性表面上的拓扑电子态的能量和空间局域性急剧发展。还显示出所有不对称平板均显示出对薄膜尺寸效应的抑制以及在薄膜的未变形表面上恢复无质量的狄拉克电子。该结果与通过化学或物理功能化对拓扑绝缘体薄膜进行有效的带隙工程有关。 (C)2016 Elsevier B.V.保留所有权利。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号