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Optical and Structural Properties of Indium Doped Bismuth Selenide Thin Films

机译:铟掺杂铋硒化薄膜的光学和结构性

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In: Bi_2Se_3 crystals were grown by Bridgman method at a growth velocity of 0.5cm/h with temperature gradient of 650 C/cm in our laboratory. The thin films of In:Bi_2se_3 were grown on amorphous substrate (glass) at a room temperature under a pressure of 10~(-4)Pa by thermal evaporation technique. Thin film were deposited at various thicknesses and optical absorption spectrum of such thin films, obtain in wave no. range 300 to 2600 cm~(-1). The optical energy gap calculated from this data were found to be inverse function of square of thickness, particularly for thickness about 1800 A or less. This dependence is explained in terms of quantum size effect. For thicker films, the bandgap is found to be independent of film thickness. For the surface stud of the as grown thin film by using AFM, which shows continuous film with some step height and surface roughness found in terms of few nm and particle size varies with respect to thickness.
机译:在:我们实验室中,Bridgman方法通过Bridgman方法生长0.5cm / h的生长速度,其温度梯度为650c / cm。通过热蒸发技术在室温下在室温下在Amorphous基板(玻璃)上生长薄膜。在这种薄膜的各种厚度和光学吸收光谱处沉积薄膜,在波线中获得。范围300至2600cm〜(-1)。发现从该数据计算的光能间隙被发现为厚度方形的逆函数,特别是约1800A或更小的厚度。在量子尺寸效应方面解释了这种依赖性。对于较厚的薄膜,发现带隙与膜厚度无关。对于通过AFM的作为生长薄膜的表面剥离,其示出了具有一些步进高度的连续膜,并且在几个NM的表面粗糙度和粒度相对于厚度变化而变化。

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