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Observation of a Single Electron on a Alkanethiol-Protected Au Nanodot in a Double-barrier Tunneling Structure by Noncontact Atomic-Force Spectroscopy

机译:非接触原子力光谱法在双势垒隧穿结构中用烷硫醇保护的金纳米点上的单电子观察

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摘要

Nanomechanical devices have attracted much attention not only for their interesting phenomenon including mechanical motion but also for applications in electronics and precision measuring method. For understanding the operation of nanomechanical single-electron devices, the observation of a single electron on a nanodot in a double-barrier tunnelling structure is important. Here we measure the cantilever frequency shift (Δf)-sample voltage (V{sub}s) characteristic in a double-barrier tunneling structure that consists of an Au coated cantilever in vacuum, 1-decanethiol (CH{sub}3(CH{sub}2){sub}9SH) protected Au nanodot, 1-octanethiol (CH{sub}3(CH{sub}2){sub}7SH) self-assembled monolayer (SAM)/Au substrate by noncontact atomic-force spectroscopy (nc-AFS) technique. We demonstrate and discuss single-electron counting on a single nanodot caused by the Coulomb blockade (CB) phenomena.
机译:纳米机械装置不仅引起了人们的关注,包括机械运动,而且还引起了人们的广泛关注,包括机械运动,以及在电子学和精密测量方法中的应用。为了理解纳米机械单电子器件的操作,在双势垒隧穿结构中观察纳米点上的单个电子非常重要。在这里,我们测量了双势垒隧穿结构中的悬臂频移(Δf)-采样电压(V {sub} s)特性,该结构由真空中镀金的悬臂,1-癸硫醇(CH {sub} 3(CH { sub} 2){sub} 9SH)保护的金纳米点,1-辛硫醇(CH {sub} 3(CH {sub} 2){sub} 7SH)自组装单层(SAM)/ Au衬底,采用非接触原子力光谱法(nc-AFS)技术。我们演示并讨论了由库仑阻塞(CB)现象引起的单个纳米点上的单电子计数。

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