Control of degradation processes in electronic devices and prognosis of the reliability by means of informative parameters system

V. K. Aladinskii; A. R. Kasimov

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Control of degradation processes in electronic devices and prognosis of the reliability by means of informative parameters system

机译：通过信息参数系统控制电子设备中的降解过程并预测可靠性

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摘要

The method of the control of degradation processes and reliability prognosis for electronics products by means of informative parameters system is suggested. For improvement of method's sensitivity they-radiation is applied.

机译：提出了利用信息参数系统控制电子产品降解过程和可靠性的方法。为了提高方法的灵敏度，应用了辐射。

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《Измерительная техниκа》 |1998年第1期|共3页
作者
V. K. Aladinskii; A. R. Kasimov;
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正文语种 rus
中图分类计量学;
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1. Control of degradation processes in electronic devices and prognosis of the reliability by means of informative parameters system [J] . V. K. Aladinskii, A. R. Kasimov Измерительная техниκа . 1998,第1期

机译：通过信息参数系统控制电子设备中的降解过程并预测可靠性
2. Manufacturing Quality Control Systems of Power Semiconductor Devices and Informative Parameters of Their Reliability [J] . A. V. Efanov, A. B. Ershov, V. N. Shemyakin, Russian electrical engineering . 2019,第3期

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3. CONROL OF DEGRADATION PROCESSES IN ELECTRONIC DEVICES AND PREDICTION OF THEIR RELIABILITY [J] . V. K. Aladinskii, A. R. Kasimov Measurement Techniques . 1998,第1期

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机译：半导体电子器件的退化，可靠性和失效

Control of degradation processes in electronic devices and prognosis of the reliability by means of informative parameters system

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