Degradation, Reliability, and Failure of Semiconductor Electronic Devices

摘要

We show how defects in semiconductor device structures are formed, how they can affect the properties and reliability of devices, and how they might be avoided. Examples will be drawn from wide band gap semiconductor materials and devices we have fabricated in-house or examined for DARPA, collaborators in the P&E CTA, a power electronics MTO, or an SBIR.