首页> 外文期刊>富士時報 >Prolongation and estimation of longevity of successful on-load cycle operation of low-voltage switchgears
【24h】

Prolongation and estimation of longevity of successful on-load cycle operation of low-voltage switchgears

机译:低压开关柜有载循环成功运行的延长和寿命估计

获取原文
获取原文并翻译 | 示例
获取外文期刊封面目录资料

摘要

The prolongation of successful on-load cycle operation of low-voltage switchgear is important for the development of new products that meet global standards and are environmentally safe. Research related to longevity prolongation has focused mainly on analysis of circuitbreaking phenomena. Fuji Electric has achieved good results by evaluating and analyzing the phenomena associated with both circuit-making and circuit-breaking operations. This paper describes technology for reducing contact bounce time, material for achieving high-performance contacts, and a method for electrically estimating the longevity of successful on-load cycle operation as examples of efforts to establish essential technology. An overview of recent equipment for electrically evaluating longevity is also presented.
机译:低压开关柜成功的有载循环运行时间的延长对于开发符合全球标准且对环境安全的新产品至关重要。与寿命延长有关的研究主要集中在断路现象的分析上。通过评估和分析与电路制造和断路操作相关的现象,富士电机取得了良好的效果。本文介绍了用于减少触点弹跳时间的技术,用于实现高性能触点的材料以及用于电气评估成功的有载循环运行寿命的方法,以此作为建立关键技术的示例。还概述了用于电寿命评估的最新设备。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号